KPFM surface photovoltage measurement and numerical simulation
نویسندگان
چکیده
منابع مشابه
Surface potential of chalcopyrite films measured by KPFM
Atomic force microscopy is widely used to characterize the surface topography of a variety of samples. Kelvin probe force microscopy (KPFM) additionally allows determining images of the surface potential with nanometer resolution. The KPFM technique will be introduced and studies on surfaces of chalcopyrite semiconductors for solar cell absorbers will be presented. It is shown that operation in...
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ژورنال
عنوان ژورنال: EPJ Photovoltaics
سال: 2019
ISSN: 2105-0716
DOI: 10.1051/epjpv/2019002